International Journal of Research in Advanced Electronics Engineering
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P-ISSN: 2708-4558, E-ISSN: 2708-4566

International Journal of Research in Advanced Electronics Engineering


2022, Vol. 3, Issue 2, Part A
On influence of mismatch-induced stress on charge carriers mobility in an implanted-junction rectifier


Author(s): EL Pankratov

Abstract: In this paper we analyze changing of charge carrier’s mobility in an implanted-junction rectifier under influence of miss match-induced stress. A model for description the considered situation is introduced. An analytical approach for analysis of mass transfer is introduced. The model gives a possibility to take into account the simultaneous changing of parameters of mass transport in space and time. At the same time the approach gives a possibility to take into account nonlinearity charge carrier’s transport.

Pages: 93-98 | Views: 10 | Downloads: 5

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How to cite this article:
EL Pankratov. On influence of mismatch-induced stress on charge carriers mobility in an implanted-junction rectifier. Int J Res Adv Electron Eng 2022;3(2):93-98.
International Journal of Research in Advanced Electronics Engineering
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